Secondary Ion Mass Spectrometry: SIMS IX
by A. Benninghoven
Book Description
Consists of over 200 papers by acknowledged experts in their specialized fields. Offers a superlative overview of current research and technology in diverse areas running the gamut from environmental problems to depth profiling and semiconductors.
The publisher, John Wiley & Sons
Consists of over 200 papers by acknowledged experts in their specialized fields. Offers a superlative overview of current research and technology in diverse areas running the gamut from environmental problems to depth profiling and semiconductors.
Keywords: Secondary Ion Mass Spectrometry: SIMS IX, Books, A. Benninghoven, Y. Nihei, R. Shimizu, H. W. Werner, Science/Mathematics, Mass Spectrometry, Science, Physics, Chemistry - Industrial & Technical
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