Secondary Ion Mass Spectrometry : A Practical Handbook for Depth Profiling and Bulk Impurity Analysis
by R. G. Wilson
Book Description
Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This book] is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry." —Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985. The book will certainly find its place as a reference work in most laboratories using this methodology" —Analytica Chimica Acta 1987 (0 471-01056-1) 1,227 pp. Secondary Ion Mass Spectrometry Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS VI) Edited by A. Benninghoven, A.M. Huber, and H. W. Werner "The international SIMS conferences have been held every two years since 1977. They are recognized as one of the major forums for scientists, instrument manufacturers, and other researchers actively engaged in this rapidly expanding field…this volume is a valuable account of the latest advances in the field of SIMS, and of the research trends of some of the most respected experts in the field.…it is recommended for the libraries of all academic and industrial institutions where SIMS research is ongoing.…it should prove a valuable reference source for years to come." —Applied Spectroscopy 1988 (0 471-91832-6) 1,078 pp.
The publisher, John Wiley & Sons
A guide to how and when to use secondary ion mass spectrometry (SIMS), describing the procedures and revealing many of the fine points of the quantitative capabilities of SIMS as applied to many kinds of materials. This information is not to be found elsewhere in book form and, for the most part, is not published in the literature. Offers many tips and tricks to obtaining and interpreting SIMS data in depth-profiling and bulk-impurity analysis, supported by data obtained using both magnetic...  read more
Keywords: Secondary Ion Mass Spectrometry : A Practical Handbook for Depth Profiling and Bulk Impurity Analysis, Books, R. G. Wilson, F. A. Stevie, C. W. Magee, Secondary ion mass spectrometr, Mass Spectrometry, Science, Chemistry - Analytic, Chemistry - Industrial & Technical
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